Description
The MT6120L Series features include:
DIN standard eyepiece HWF10X and DIN focusing HWF10XF eyepiece with cross-line reticle
Centerable quadruple nosepiece with Semi Plan Strain free objectives, 10X, 20X, 40X
10X Dispersion staining objective
Rotatable stage with graduation 360°, with vernier graduations to 0.1° degree
Rotatable polarizer in swing-out mount, analyzer and Bertrand lens in sliding mount
Coaxial coarse and fine adjustment with graduation
Built-in LED transmitted light
Includes First order red plate and Analyzer in sliding mount
Blue clear daylight filter, 29.8 unmounted
Coarse and fine focus knobs
Tension adjustment control for zoom knob rotation adjustment
Stage lock lever to prevent slide breakage
Auto-Voltage sensing power supply
PLM (Polarizing Light Microscopy):
This method is useful for the qualitative identification of asbestos and the semi-quantitative determination of asbestos in bulk samples. This method measures the percentage of asbestos as perceived by the analyst in comparison to standard projections, photographs and experience. The quality of the results are dependant upon the skill and judgment of the operator.
The MT6120L & MT6130L Series Asbestos PLM Microscopes for Bulk Fiber Identification (NIOSH 9002) The MT6120L & MT6130L Series has been designed as a versatile, modular, ergonomic microscope system which are ideally suited in education, research or advanced laboratory applications.
Ergonomic placement of controls allows for stress free operation, increased lab efficiency and maximum productivity. LED transmitted light illuminator with strain free condenser and strain free ∞ Infinity Corrected objectives and a 10X Dispersion Staining Objective.
The MT6120L & MT6130L Series offers an outstanding range of features and optical performance with an emphasis on all newly engineered high performance optics based on Meiji Techno’s ICOS Optical System (Infinity Corrected Optical System). The new strain free optics provide exceptionally bright, crisp images, with good color rendition and superior flat fields of view.



